Dit-Yan Yeung,James Kwok,Ana Fred,Fabio Roli,Dick de Ridder: Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings



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Author: Dit-Yan Yeung,James Kwok,Ana Fred,Fabio Roli,Dick de Ridder
Number of Pages: 960 pages
Published Date: 15 Sep 2006
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Publication Country: Berlin, Germany
Language: English
ISBN: 9783540372363
Download Link: Click Here
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